2025IEEE Transactions on Reliability

Adaptive Random Testing of Deep Learning Systems Using Image Hashing

Yi, Linwei, Cui, Chenhui, Huang, Rubing, Towey, Dave, and Wang, Rongcun

Deep learningPattern recognition (psychology)Hash functionImage (mathematics)Reliability (semiconductor)Probability distributionImage processingRandom testing

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Adaptive Random Testing of Deep Learning Systems Using Image Hashing

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